型號 |
廠商 |
描述 |
文檔 |
詢價 |
MC100EP116FAR2G |
ON(安森美) |
IC TCVR/DRVR HEX DIFF ECL 32LQFP |
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ISL55100BIRZ-T |
Intersil(英特矽爾) |
IC COMP DRVR/WINDOW 18V 72-QFN |
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SN74ABTE16245DLG4 |
TI(德州儀器) |
IC 16BIT I-WS BUS TXRX 48-SSOP |
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SN74ABT18245ADL |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
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SN74FB2033ARCRG3 |
TI(德州儀器) |
IC REGISTERED TXRX 8BIT 52QFP |
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SN74ABT8646DLG4 |
TI(德州儀器) |
IC SCAN TEST DEVICE 28-SSOP |
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SN74LVT8980ADW |
TI(德州儀器) |
IC TEST-BUS CONTROLLER 24-SOIC |
|
|
SN74ABT8996DW |
TI(德州儀器) |
IC ADDRESSABLE SCAN PORT 24-SOIC |
|
|
SN74ABT8996PW |
TI(德州儀器) |
IC ADDRESSABLE SCAN PORT 24TSSOP |
|
|
SN74ACT8997DW |
TI(德州儀器) |
IC SCAN-PATH LINKER 28-SOIC |
|
|
SN74LVT8996DW |
TI(德州儀器) |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
|
|
MC10EP17DWR2G |
ON(安森美) |
IC RCVR/DRVR QUAD ECL DFF 20SOIC |
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SN74BCT8245ADW |
TI(德州儀器) |
IC SCAN TEST DEVICE TXRX 24-SOIC |
|
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SN74BCT8244ADWE4 |
TI(德州儀器) |
IC SCAN TEST DEVICE BUFF 24-SOIC |
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|
SN74BCT8244ADW |
TI(德州儀器) |
IC SCAN TEST DEVICE BUFF 24-SOIC |
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|
MC10EP17MNTXG |
ON(安森美) |
IC RCVR/DRVR QUAD DIFF ECL 20QFN |
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MC100EP17MNTXG |
ON(安森美) |
IC RCVR/DRVR QUAD DIFF ECL 20QFN |
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MC10EP17DTR2G |
ON(安森美) |
IC RCVR/DRVR QUAD DIFF 20-TSSOP |
|
|
NB100LVEP17MNR2G |
ON(安森美) |
IC DRVR ECL QUAD 2.5V/3.3V 24QFN |
|
|
NB100LVEP17DTR2G |
ON(安森美) |
IC DRV/RCV ECL QUAD DIFF 20TSSOP |
|
|
MC100EP17DTR2G |
ON(安森美) |
IC RCVR/DRV ECL QUAD DFF 20TSSOP |
|
|
MC10EP16TDG |
ON(安森美) |
IC RCVR/DRVR ECL DIFF 5V 8SOIC |
|
|
MC100EP16VTDG |
ON(安森美) |
IC RCVR/DRVR ECL DIFF VAR 8SOIC |
|
|
MC100EP16TDG |
ON(安森美) |
IC RCVR/DRVR ECL DIFF 5V 8SOIC |
|
|
SN74SSTVF32852KR |
TI(德州儀器) |
IC BUFFER 24BIT-48BIT 114LFBGA |
|
|
MC10E416FNG |
ON(安森美) |
IC LINE RCVR QUINT DIFF 28-PLCC |
|
|
MC100E116FNG |
ON(安森美) |
IC LINE RECEIVER QUINT 28-PLCC |
|
|
MC10E116FNG |
ON(安森美) |
IC LINE RCVR QUINT ECL 5V 28PLCC |
|
|
SN74BCT8373ADW |
TI(德州儀器) |
IC SCAN TEST DEVICE LATCH 24SOIC |
|
|
NB7VPQ16MMNG |
ON(安森美) |
IC CML PRE-EMPH DRIVER 16QFN |
|
|
NB7VPQ16MMNHTBG |
ON(安森美) |
IC CML DVR PRE-EMPH 1CH 16-QFN |
|
|
MC10EP16TDTG |
ON(安森美) |
IC RCVR/DRVR ECL DIFF 5V 8TSSOP |
|
|
MC100EP16VTDTG |
ON(安森美) |
IC RCVR/DRVR ECL DIFF VAR 8TSSOP |
|
|
MC100EP16TDTG |
ON(安森美) |
IC RCVR/DRVR ECL DIFF 5V 8TSSOP |
|
|
SN74LVT8986ZGV |
TI(德州儀器) |
IC LINK ADDRSS SCAN-PORT 64-BGA |
|
|
SN74LVTH18504APMG4 |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
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SN74LVTH18502APMG4 |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
|
|
SN74ACT8997DWR |
TI(德州儀器) |
IC SCAN-PATH LINKER 28-SOIC |
|
|
MC10E416FNR2G |
ON(安森美) |
IC LINE RCVR QUINT DIFF 28-PLCC |
|
|
MC10E116FNR2G |
ON(安森美) |
IC LINE RECEIVER QUINT 28-PLCC |
|
|
MC100E116FNR2G |
ON(安森美) |
IC LINE RECEIVER QUINT 28-PLCC |
|
|
SN74LVT8980ADWRG4 |
TI(德州儀器) |
IC TEST-BUS CONTROLLER 24-SOIC |
|
|
SN74LVT8980ADWR |
TI(德州儀器) |
IC TEST-BUS CONTROLLER 24-SOIC |
|
|
SN74ABTE16245DLR |
TI(德州儀器) |
IC 16BIT I-WS BUS TXRX 48-SSOP |
|
|
NB4N855SMR4G |
ON(安森美) |
IC DRVR/RCVR/BUFF/XLATOR MICRO10 |
|
|
SN74ABT8646DLR |
TI(德州儀器) |
IC SCAN TEST DEVICE 28-SSOP |
|
|
NB7VPQ16MMNTXG |
ON(安森美) |
IC COPPER/CABLE DVR PROG 16-QFN |
|
|
NB4N527SMNR2G |
ON(安森美) |
IC DRVR/RCVR/BUFF/XLATOR 16-QFN |
|
|
SN74LVT8996DWR |
TI(德州儀器) |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
|
|
MC100EP16VTMNR4G |
ON(安森美) |
IC RCVR/DRVR ECL DIFF VAR |
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