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18665920580
| 型號 | 廠商 | 描述 | 文檔 | 詢價(jià) |
| SY100EP16VSKY | Microchip(美國微芯) | IC LINE RCVR DIFF 3.3/5V 8-MSOP |  |
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| SY100EL16VSZG-TR | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-SOIC | |
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| SY100EL16VSZG | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-SOIC | |
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| SY100EL16VSKG-TR | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-MSOP | |
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| SY100EL16VSKG | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-MSOP | |
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| SY100EL16VOKG-TR | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 10-MSOP | |
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| SY100EL16VOKG | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 10-MSOP | |
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| SY100EL16VFZG | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-SOIC | |
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| SY100EL16VEKG-TR | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-MSOP | |
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| SY100EL16VBZG | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-SOIC | |
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| SY100EL16VBKG-TR | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-MSOP | |
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| SY100EL16VBKG | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-MSOP | |
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| SY100EL16VAKG | Microchip(美國微芯) | IC RCVR DIFF 3.3/5V 8-MSOP | |
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| SY100E416JY | Microchip(美國微芯) | IC LINE RCVR QUINT DIFF 28-PLCC | |
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| SY100E212JZ TR | Microchip(美國微芯) | IC REGISTER 3BIT SCAN 28-PLCC | |
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| SY100E212JZ | Microchip(美國微芯) | IC REGISTER 3BIT SCAN 28-PLCC | |
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| SN74S1050NE4 | TI(德州儀器) | IC 12-BIT BUS TERM ARRAY16-DIP | |
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| SN74S1050N | TI(德州儀器) | IC 12-BIT BUS TERM ARRAY16-DIP | |
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| SN74LS181NE4 | TI(德州儀器) | IC ARTHMTC UNIT/FUN GEN 24-DIP | |
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| SN74LS181N | TI(德州儀器) | IC ARTHMTC UNIT/FUN GEN 24-DIP | |
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| SN74SSTU32864CGKER | TI(德州儀器) | IC 25BIT CONFIG REG BUFF 96LFBGA | |
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| SN74SSTVF16857VRG4 | TI(德州儀器) | IC REG BUFF 14BIT SSTL 48-TVSOP | |
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| SN74S1052DWRE4 | TI(德州儀器) | IC 16-BIT BUS TERM ARRAY20-SOIC | |
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| SN74S1050DRE4 | TI(德州儀器) | IC 12-BIT BUS TERM ARRAY16-SOIC | |
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| SN74S1050DR | TI(德州儀器) | IC 12-BIT BUS TERM ARRAY16-SOIC | |
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| SN74LVC1404DCURE4 | TI(德州儀器) | IC OSCILLATOR DRIVER US8 | |
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| SN74LS31DRE4 | TI(德州儀器) | IC HEX DELAY ELEMENT 16-SOIC | |
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| SN74LS31DR | TI(德州儀器) | IC HEX DELAY ELEMENT 16-SOIC | |
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| SN74LS283DRE4 | TI(德州儀器) | IC BIN FULL 4BIT ADD CAR 16-SOIC | |
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| SN74LS283DR | TI(德州儀器) | IC BIN FULL 4BIT ADD CAR 16-SOIC | |
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| SN74ACT1284PWE4 | TI(德州儀器) | IC 7BIT BUS INTERFC 3ST 20-TSSOP | |
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| SN74ACT1284PW | TI(德州儀器) | IC 7BIT BUS INTERFC 3ST 20-TSSOP | |
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| SN74ABTH16460DLR | TI(德州儀器) | IC REGISTERED TRANSCVR 56SSOP | |
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| SN74ABT8952DLRG4 | TI(德州儀器) | IC SCAN TESST DEVICE 28-SSOP | |
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| SN74ABT8952DLR | TI(德州儀器) | IC SCAN TESST DEVICE 28-SSOP | |
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| SN74ABT8652DWRE4 | TI(德州儀器) | IC SCAN TEST DEVICE 28-SOIC | |
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| SN74ABT8652DWR | TI(德州儀器) | IC SCAN TEST DEVICE 28-SOIC | |
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| SN74ABT8652DLRG4 | TI(德州儀器) | IC SCAN TEST DEVICE 28-SSOP | |
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| SN74ABT8652DLR | TI(德州儀器) | IC SCAN TEST DEVICE 28-SSOP | |
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| SN74ABT8646DWRE4 | TI(德州儀器) | IC SCAN TEST DEVICE 28-SOIC | |
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| SN74ABT8646DWR | TI(德州儀器) | IC SCAN TEST DEVICE 28-SOIC | |
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| SN74ABT8543DWRE4 | TI(德州儀器) | IC SCAN TEST DEVICE 28-SOIC | |
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| SN74ABT8543DWR | TI(德州儀器) | IC SCAN TEST DEVICE 28-SOIC | |
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| SN74ABT8543DLR | TI(德州儀器) | IC SCAN TEST DEVICE 28-SSOP | |
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| SN74ABT18640DLRG4 | TI(德州儀器) | IC SCAN TEST DEVICE 18BIT 56SSOP | |
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| SN74ABT18640DLR | TI(德州儀器) | IC SCAN TEST DEVICE 18BIT 56SSOP | |
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| SN74ABT18504PMRG4 | TI(德州儀器) | IC SCAN TEST DEVICE 20BIT 64LQFP | |
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| SN74ABT18504PMR | TI(德州儀器) | IC SCAN TEST DEVICE 20BIT 64LQFP | |
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| SN74GTLP22034ZQLR | TI(德州儀器) | IC TXRX ADJ EDGE 8BIT 56BGA | |
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| SN74GTLP22033ZQLR | TI(德州儀器) | IC TXRX ADJ EDGE 8BIT 56BGA | |
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